IEEE OTTAWA AP/MTT WEBINAR: Characterizat ion and Modeling of GaN HEMT Trapping Effects for Microwave Circuit Design
Virtual: https://events.vtools.ieee.org/m/238482Speaker(s): Prof. José C. Pedro, Virtual: https://events.vtools.ieee.org/m/238482
2 events found.
Electrical safety, Ground Fault monitorin g for Electric Vehicles and Charging Stations
Online(link will be provided to registrants), Ontario, Virtual: https://events.vtools.ieee.org/m/236400Speaker(s): Frédéric Mathieu , Online(link will be provided to registrants), Ontario, Virtual: https://events.vtools.ieee.org/m/236400