VNA Measurements and De-embedding for High Speed and RF Applications
Virtual: https://events.vtools.ieee.org/m/474480Webinar Description: Join us for an insightful webinar focused on the critical topic of de-embedding in high-frequency and high-speed digital designs. As the demand for faster and more reliable electronic devices continues to grow, understanding de-embedding techniques has become essential for engineers and designers working in the fields of RF, microwave, and digital signal integrity.... Read more