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Virtual Talk: Quantum microscopy using spatially correlated photons / Microscopie quantique en utilisant des photons spatialement corrélés

April 15 @ 3:30 pm - 4:30 pm

*Please note that this presentation will be given as a fully virtual event. Webinar access information will be communicated to IEEE members and registered people. Please contact the hosts for more information. * Veuillez noter que cette présentation sera donné de façon virtuelle. Les informations d’accès au webinaire seront communiquées aux membres de l’IEEE et aux personnes inscrites. Veuillez contacter les organisateurs pour plus d’informations. Abstract: Exploiting spatial correlations between photons is a fundamental in quantum imaging. Correlation-based imaging, a scheme whereby one photon from a pair interacts with an object before reaching the detection system. The joint measurement of the two photons then reveals the image of the object. Though the image reconstruction was initially implemented using computational techniques that employ a single pixel with no spatial resolution on its own, modern implementations can make use of arrays of single-photon sensitive detectors. Novel imaging sensors such as arrays of single photon avalanche diodes (SPADs) have enabled two- and three-dimensional imaging, the latter being enabled by the high temporal resolution. Furthermore, their high-frame rate, compared to rival technology, dramatically reduces the acquisition time required to spatially characterise quantum states and form a correlation image. In this talk, we will provide an overview of the recent developments in 2D, and 3D correlation-based imaging using photon pairs and enabled by SPAD cameras. Particularly, we will focus on optical designs geared towards applications in microscopy. Co-sponsored by: Chapitre Étudiant SPIE/OPTICA – Polytechnique Speaker(s): Bienvenu Ndagano Virtual: https://events.vtools.ieee.org/m/410417

Details

Date:
April 15
Time:
3:30 pm - 4:30 pm
Website:
https://events.vtools.ieee.org/m/410417

Venue

Virtual: https://events.vtools.ieee.org/m/410417