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April 2018

Smart Power Devices and ICs with Wide and Extreme Bandgap Semiconductors

April 24 @ 3:00 pm - 4:30 pm
Room: EV 3-309, Bldg: EV Building

Co-sponsored by: IEEE Montreal Section and Concordia University Silicon has long been the dominant, often exclusive, semiconductor of choice for high voltage power devices and ICs.  Over the last decade, power switching devices made of two wide bandgap (WBG) semiconductors, SiC and GaN are impacting power electronics systems with their commercial availability and performance improvement, and hence less power and more energy efficient, over conventional counterparts.  In this talk, the present status of the research, development and/or commercialization, as well…

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Precision Motion Control for Smart Micro/Nano-Positioning Systems with High Nonlinearities

April 26 @ 11:30 am - 1:00 pm
Room: MC603, Bldg: McConnell Engineering Building

Co-sponsored by: IEEE Montreal Section, Power Electronics Society Chapter METiS Talk Series The global research in the areas of micro-robotics, high-precision control, and modern mechatronic systems is expanding. Recently, high precision positioning techniques have become widely used in several applications related to semiconductors, biomedical science, optics, haptics, and microscopy. For example, theoretical work in molecular manufacturing has highlighted the need for very small (a fraction of a nanometer) and very accurate manipulators, which simultaneously have a wide range of motion,…

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May 2018


May 17 @ 6:00 pm - 8:00 pm
Room: EV 1.162, Bldg: EV Building

This lecture outlines the physical mechanisms that lead to electromagnetic shielding in materials and then describes how the materials can be used to fabricate a shielded enclosure. The limitations of shielding performance of the enclosures due to the enclosure structure are described. Refreshments will be served. OIQ (Quebec Order of Engineers) members may claim this event for continuing education hours provided that it is related to the member's professional activities as defined in: OIQ Règlement sur la formation continue article…

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